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Michael Eric Gehm

Gehm

Professor of Electrical and Computer Engineering

Appointments and Affiliations

  • Professor of Electrical and Computer Engineering
  • Associate Professor of Physics

Contact Information

  • Office Location: 3463 CIEMAS, Fitzpatrick Center, Durham, NC 27708
  • Office Phone: (919) 660-5544
  • Email Address: michael.gehm@duke.edu

Education

  • Ph.D. Duke University, 2003
  • M.S. Duke University, 1998
  • B.S. Washington University in St. Louis, 1992

Research Interests

Primarily computational and compressive sensing and measurement in all modalities (with special emphasis in Electromagnetic/Optical from RF to x-ray and all forms of Mass spectrometry), with side interests in optical physics, high-performance x-ray simulation, and rapid-prototyping as a means of creating advanced electromagnetic structures

Awards, Honors, and Distinctions

  • Fellow. OSA (The Optical Society). 2020

Courses Taught

  • ECE 270DL: Fields and Waves: Fundamentals of Information Propagation
  • ECE 270L9: Fields and Waves: Fundamentals of Information Propagation (Lab)
  • ECE 392: Projects in Electrical and Computer Engineering
  • ECE 494: Projects in Electrical and Computer Engineering
  • ECE 590: Advanced Topics in Electrical and Computer Engineering
  • ECE 675: Optical Imaging and Spectroscopy
  • ECE 899: Special Readings in Electrical Engineering

In the News

Representative Publications

  • Horvath, KL; Piacentino, EL; Serpa, RB; Aloui, T; Vyas, R; Zhilichev, Y; von Windheim, J; Sartorelli, ML; Parker, CB; Denton, MB; Gehm, ME; Glass, JT; Amsden, JJ, Design considerations for a cycloidal mass analyzer using a focal plane array detector., Journal of Mass Spectrometry : Jms, vol 57 no. 7 (2022) [10.1002/jms.4874] [abs].
  • Ruiz, SD; Gude, ZW; Hurlock, AX; Ferguson, K; Miller, C; Carpenter, JH; Greenberg, JA; Gehm, ME, Characterization of photon counting detectors for x-ray diffraction (XRD) applications, Smart Structures and Materials 2005: Active Materials: Behavior and Mechanics, vol 12104 (2022) [10.1117/12.2618954] [abs].
  • Hurlock, AX; Ruiz, SD; Carpenter, JH; Greenberg, JA; Gehm, ME, Spectrally responsive edge-illumination (SREI) x-ray phase contrast imaging (XPCI), Smart Structures and Materials 2005: Active Materials: Behavior and Mechanics, vol 12104 (2022) [10.1117/12.2618827] [abs].
  • Piacentino, EL; Serpa, RB; Horvath, KL; Vyas, R; Aloui, T; Parker, CB; Carlson, JB; Keogh, J; Sperline, RP; Sartorelli, ML; Stoner, BR; Gehm, ME; Glass, JT; Denton, MB; Amsden, JJ, The Long Neglected Cycloidal Mass Analyzer., Analytical Chemistry, vol 93 no. 33 (2021), pp. 11357-11363 [10.1021/acs.analchem.1c02001] [abs].
  • Vyas, R; Aloui, T; Horvath, K; Herr, PJ; Kirley, MP; Parker, CB; Keil, AD; Carlson, JB; Keogh, J; Sperline, RP; Denton, MB; Sartorelli, ML; Stoner, BR; Gehm, ME; Glass, JT; Amsden, JJ, Improving the Performance of a Cycloidal Coded-Aperture Miniature Mass Spectrometer., Journal of the American Society for Mass Spectrometry, vol 32 no. 2 (2021), pp. 509-518 [10.1021/jasms.0c00378] [abs].